Software Further Advances Modeling, Characterization Efficiency with Support for Latest Advanced Models, Significantly Improved Measurement Speed
Highlights:
- IC-CAP delivers a complete DynaFET System solution for modeling GaN and GaAs HEMTs with a significant measurement speed improvement
- MBP supports BSIM-IMG for FD-SOI technologies
- MQA provides support for mixed SPICE syntax and the advanced 16-nm TSMC Modeling Interface (TMI) library
Press Release:
http://about.keysight.com/en/newsroom/pr/2016/22feb-nrb16032.shtml
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