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Stanford Research Systems SR250 Boxcar Gated Integrator Module

Manufacturer Stanford Research Systems
Category:

Description

Description

  • Gate width from 2 ns to 15 µs
    (expandable to 150 µsec)
  • Internal rate generator
  • Active baseline subtraction
  • Shot-by-shot output
  • Gate output for precise gate timing
  • Average 1 to 10,000 samples
  • DC to 20 kHz repetition rate
  • Low jitter

 

NIST-Traceable Calibrations

Standard Calibration Price (without data): Request a Quote
ANSI Z540 Calibration Price (with as-found & as-left data): Request a Quote
ISO/IEC 17025:2005 Accredited Calibration Price (with data & uncertainties): Request a Quote
ANSI Z540.3 with data & uncertainties and Guardbanding: Request a Quote
Test & Measurement Equipment Repair Services: Request a Quote




User Guide